TY  - BOOK
AU  - Bowen,W.Richard
AU  - Hilal,Nidal
TI  - Atomic force microscopy in process engineering: introduction to AFM for improved processes and products 
SN  - 9781856175173 (hbk.) :
PY  - 2009///
CY  - Oxford
PB  - Butterworth-Heinemann
KW  - Atomic force microscopy
KW  - Production engineering
ER  -