Atomic force microscopy in process engineering :  introduction to AFM for improved processes and products / 
[edited by] W. Richard Bowen and Nidal Hilal 
 - Oxford :  Butterworth-Heinemann,  2009 
 - xvi, 283 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>9781856175173 (hbk.) :  RM427.68 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy<br/>Production engineering