TY  - BOOK
AU  - Fultz,B.
AU  - Howe,James M.
TI  - Transmission electron microscopy and diffractometry of materials
SN  - 3540437649 (alk. paper)
PY  - 2002///
CY  - Berlin, New York
PB  - Springer
KW  - Materials
KW  - Microscopy
KW  - Transmission electron microscopy
KW  - X-ray diffractometer
N1  - Includes bibliographical references and index
ER  -