Fultz, B. <br/><br/>
Transmission electron microscopy and diffractometry of materials / 
Brent Fultz, James Howe 
 - 2nd ed. 
 - Berlin ;  New York :  Springer,  2002 
 - xxi, 748 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>3540437649 (alk. paper) 9783540437642  RM329.45 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy<br/>Transmission electron microscopy<br/>X-ray diffractometer