TY  - BOOK
AU  - Schubert,Mathias
TI  - Infrared ellipsometry on semiconductor layer structures: phonons, plasmons, and polaritons 
SN  - 3540232494
PY  - 2004///
CY  - Berlin
PB  - Springer
KW  - Ellipsometry
KW  - Layer structure (Solids)
ER  -