Schubert, Mathias <br/><br/>
Infrared ellipsometry on semiconductor layer structures :  phonons, plasmons, and polaritons / 
Mathias Schubert 
 - Berlin :  Springer,  2004 
 - xi, 193 p. :  ill. ;  25 cm. 
 - Springer tracts in modern physics,  v. 209  0081-3869 ; .
<br/><br/><label>ISBN: </label>3540232494  RM662.89 9783540232490 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Ellipsometry<br/>Layer structure (Solids)