Contamination control in trace element analysis 
(by) Morris Zief (and) James W. Mitchell 
 - New York :  John Wiley & Sons,  1976 
 - 262 p. :  ill. ;  24 cm. 
 - Chemical analysis  v.47 .
<br/><br/> 'A Wiley-Interscience publication'  Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0471611697 
<br/><br/><label>LCCN: </label>76-016837 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Trace elements--Analysis<br/>Contamination (Technology)