Latino, Robert J. <br/><br/>
Root cause analysis  improving performance for bottom-line results /  [electronic resource] : 
Robert J. Latino, Kenneth C. Latino 
 - 3rd ed. 
 - Boca Raton :  CRC/Taylor & Francis,  2006 
<br/><br/> Access to 2http://www.engnetbase.com/ejournals/search/advsearch1.asp3 and type in the title. You may access the full text after you type in the advanced search screen 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0849353408 9780849353406 
<br/><br/><label>LCCN: </label>2005-030996 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Quality control--Data processing<br/>Industrial accidents--Investigation<br/>Critical incident technique
<br/><br/><label>Dewey Class. No.: </label>658.5/62