TY - BOOK AU - Scheffer,Lou AU - Lavagno,Luciano AU - Martin,Grant TI - EDA for IC system design, verification, and testing SN - 0849379237 U1 - 621.3815 22 PY - 2005/// CY - Boca Raton, FL PB - Taylor & Francis KW - Integrated circuits KW - Computer-aided design KW - Verification KW - Data processing N1 - Access to 2http://www.egnetbase.com/ejournals/search/advsearch1.asp3 and type in the title. You may access the full text after you type in the advanced search screen; Includes bibliographical references and index UR - https://eresourcesptsl.ukm.remotexs.co/login?url=http://www.egnetbase.com/ejournals/search/advsearch1.asp UR - http://www.engnetbase.com/ejournals/books/book_km.asp?id=4676 ER -