TY  - BOOK
AU  - Alford,Terry L.
AU  - Feldman,Leonard C.
AU  - Mayer,James W.
ED  - SpringerLink (Online service)
TI  - Fundamentals of Nanoscale Film Analysis
SN  - 9780387292618 (electronic bk.)
U1  - 621.38152 22
PY  - 2007///
CY  - Boston, MA
PB  - Springer Science+Business Media, Inc.
KW  - Thin films
KW  - Nanostructured materials
UR  - http://dx.doi.org/10.1007/978-0-387-29261-8
ER  -