Alford, Terry L. <br/><br/>
Fundamentals of Nanoscale Film Analysis  [electronic resource] / 
by Terry L. Alford, Leonard C. Feldman, James W. Mayer. 
 - Boston, MA :  Springer Science+Business Media, Inc.,  2007. 
 - 1online resource(xiv, 336 p.) :  ill., digital ;  25 cm. 
<br/><br/><label>ISBN: </label>9780387292618 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films.<br/>Nanostructured materials.
<br/><br/><label>Dewey Class. No.: </label>621.38152