TY  - BOOK
AU  - Fultz,Brent
AU  - Howe,James M.
ED  - SpringerLink (Online service)
TI  - Transmission Electron Microscopy and Diffractometry of Materials
SN  - 9783540738862 (electronic bk.)
AV  - TA417.23 .F85 2008
U1  - 620.11299 22
PY  - 2008///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin Heidelberg
KW  - Materials
KW  - Microscopy
KW  - Transmission electron microscopy
KW  - Chemistry
KW  - Characterization and Evaluation of Materials
KW  - Crystallography
KW  - Physics and Applied Physics in Engineering
KW  - Solid State Physics and Spectroscopy
KW  - Surfaces and Interfaces, Thin Films
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-3-540-73886-2
ER  -