Fultz, Brent. <br/><br/>
Transmission Electron Microscopy and Diffractometry of Materials  [electronic resource] / 
by Brent Fultz, James M. Howe. 
 - Third Edition. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2008. 
 - xix, 758 p. :  ill., digital ;  24 cm. 
<br/><br/><label>ISBN: </label>9783540738862 (electronic bk.) 9783540738855 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy.<br/>Transmission electron microscopy.<br/>Chemistry.<br/>Characterization and Evaluation of Materials.<br/>Crystallography.<br/>Physics and Applied Physics in Engineering.<br/>Solid State Physics and Spectroscopy.<br/>Surfaces and Interfaces, Thin Films.
<br/><br/><label>LC Class. No.: </label>TA417.23  / .F85 2008 
<br/><br/><label>Dewey Class. No.: </label>620.11299