Applied Scanning Probe Methods.  Characterization /  IX  [electronic resource] : 
edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. 
 - Berlin, Heidelberg :  Springer-Verlag,  2008. 
 - 387 p. :  ill., digital ;  24 cm. 
 - Nano Science and Technolgy,  1434-4904 .
<br/><br/><label>ISBN: </label>9783540740834 (electronic bk.) 9783540740827 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy.<br/>Materials--Microscopy.<br/>Chemistry.<br/>Nanotechnology.<br/>Physical Chemistry.<br/>Polymer Sciences.<br/>Solid State Physics and Spectroscopy.<br/>Surfaces and Interfaces, Thin Films.
<br/><br/><label>LC Class. No.: </label>TA417.23  / .A655 2008 
<br/><br/><label>Dewey Class. No.: </label>502.82