TY  - BOOK
AU  - Pavlov,Andrei
AU  - Sachdev,Manoj
ED  - SpringerLink (Online service)
TI  - CMOS SRAM circuit design and parametric test in nano-scaled technologies: process-aware SRAM design and test 
T2  - Frontiers in electronic testing
SN  - 9781402083631 (electronic bk.)
U1  - 621.38152 22
PY  - 2008///
CY  - Dordrecht
PB  - Springer Science + Business Media B.V
KW  - Metal oxide semiconductors, Complementary
KW  - Design
KW  - Random access memory
KW  - Nanoelectronics
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-1-4020-8363-1
ER  -