Scanning Microscopy for Nanotechnology  Techniques and Applications /  [electronic resource] : 
edited by Weilie Zhou, Zhong Lin Wang. 
 - New York, NY :  Springer Science+Business Media, LLC,  2007. 
 - xiv, 522 p., [12] p. of plates :  ill. (some col.), digital ;  24 cm. 
<br/><br/><label>ISBN: </label>9780387396200 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy.<br/>Nanotechnology.<br/>Chemistry.<br/>Nanotechnology.<br/>Characterization and Evaluation of Materials.<br/>Optical and Electronic Materials.<br/>Measurement Science, Instrumentation.
<br/><br/><label>Dewey Class. No.: </label>570