Applied Scanning Probe Methods. III Characterization - Bhushan, Bharat; Fuchs, Harald; SpringerLink (Online service) (Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006)
Keywords: Scanning probe microscopy; Scanning probe microscopy -- Industrial applications; Materials -- Microscopy; Chemistry; Nanotechnology; Surfaces and Interfaces, Thin Films; Analytical Chemistry; Physical Chemistry; Polymer Sciences; Solid State Physics and Spectroscopy