Applied Scanning Probe Methods.  Characterization /  III  [electronic resource] : 
edited by Bharat Bhushan, Harald Fuchs. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2006. 
 - xliii, 378 p. :  ill., digital ;  24 cm. 
 - NanoScience and Technology,  1434-4904 .
<br/><br/><label>ISBN: </label>9783540269106 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy.<br/>Scanning probe microscopy--Industrial applications.<br/>Materials--Microscopy.<br/>Chemistry.<br/>Nanotechnology.<br/>Surfaces and Interfaces, Thin Films.<br/>Analytical Chemistry.<br/>Physical Chemistry.<br/>Polymer Sciences.<br/>Solid State Physics and Spectroscopy.
<br/><br/><label>Dewey Class. No.: </label>502.82