TY  - BOOK
AU  - Yeung,Dit-Yan
ED  - International Workshop on Structural and Syntactic Pattern Recognition
ED  - SpringerLink (Online service)
TI  - Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings 
SN  - 9783540372417 (electronic bk.)
AV  - TK7882.P3 I57 2006
U1  - 006.4 22
PY  - 2006///
CY  - Berlin Heidelberg
PB  - Springer-Verlag GmbH.
KW  - Pattern recognition systems
KW  - Congresses
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/11815921
ER  -