Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings - International Workshop on Structural and Syntactic Pattern Recognition 2006 : Hong Kong, China); Yeung, Dit-Yan.; SpringerLink (Online service) (Berlin Heidelberg : Springer-Verlag GmbH., 2006)
Keywords: Pattern recognition systems -- Congresses