TY  - BOOK
AU  - Gusev,Evgeni
ED  - NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices
ED  - SpringerLink (Online service)
TI  - Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices 
T2  - NATO Science Series II: Mathematics, Physics and Chemistry,
SN  - 9781402043673 (electronic bk.)
AV  - TK7895.G36 N37 2005
U1  - 621.39 22
PY  - 2006///
CY  - Dordrecht
PB  - Springer
KW  - Gate array circuits
KW  - Congresses
KW  - Dielectrics
KW  - Semiconductors
KW  - Defects
KW  - Engineering
KW  - Electronic and Computer Engineering
KW  - Electronics and Microelectronics, Instrumentation
KW  - Physics and Applied Physics in Engineering
KW  - Condensed Matter
UR  - https://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/1-4020-4367-8
ER  -