Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices - NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia); Gusev, Evgeni; SpringerLink (Online service) (Dordrecht : Springer, 2006)
Keywords: Gate array circuits -- Congresses; Dielectrics -- Congresses; Semiconductors -- Defects -- Congresses; Engineering; Electronic and Computer Engineering; Electronics and Microelectronics, Instrumentation; Physics and Applied Physics in Engineering; Condensed Matter