Defects in High-k Gate Dielectric Stacks  Nano-Electronic Semiconductor Devices /  [electronic resource] : 
edited by Evgeni Gusev. 
 - Dordrecht :  Springer,  2006. 
 - x, 492 p. :  ill., digital ;  25 cm. 
 - NATO Science Series II: Mathematics, Physics and Chemistry,  220  1568-2609 ; .
<br/><br/><label>ISBN: </label>9781402043673 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Gate array circuits--Congresses.<br/>Dielectrics--Congresses.<br/>Semiconductors--Defects--Congresses.<br/>Engineering.<br/>Electronic and Computer Engineering.<br/>Electronics and Microelectronics, Instrumentation.<br/>Physics and Applied Physics in Engineering.<br/>Condensed Matter.
<br/><br/><label>LC Class. No.: </label>TK7895.G36  / N37 2005 
<br/><br/><label>Dewey Class. No.: </label>621.39