Elgamel, Mohamed A. Interconnect Noise Optimization in Nanometer Technologies [electronic resource] / by Mohamed A. Elgamel, Magdy A. Bayoumi. - Boston, MA : Springer Science+Business Media, Inc., 2006. - xviii, 137 p. : ill., digital ; 25 cm. ISBN: 9780387293660 (electronic bk.) 9780387258706 (paper) Subjects--Topical Terms: Interconnects (Integrated circuit technology)Electronic noise.Crosstalk. LC Class. No.: TK7874.53 / .E55 2006 Dewey Class. No.: 621.39