TY  - BOOK
AU  - Cullis,A.G..
AU  - Hutchison,J.L..
ED  - SpringerLink (Online service)
TI  - Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK 
SN  - 9783540319153 (electronic bk.)
AV  - QC611.6.S9 M554 2005
U1  - 621.38152 22
PY  - 2005///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin Heidelberg
KW  - Semiconductors
KW  - Surfaces
KW  - Congresses
KW  - Characterization
KW  - Materials
KW  - Microscopy
KW  - Epitaxy
KW  - High resolution electron microscopy
KW  - Chemistry
KW  - Materials Science
KW  - Electronics and Microelectronics, Instrumentation
KW  - Solid State Physics and Spectroscopy
KW  - Measurement Science, Instrumentation
UR  - https://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/3-540-31915-8
ER  -