Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK - Cullis, A. G..; Hutchison, J. L..; SpringerLink (Online service) (Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005)
Keywords: Semiconductors -- Surfaces -- Congresses; Semiconductors -- Characterization -- Congresses; Materials -- Microscopy -- Congresses; Epitaxy -- Congresses; High resolution electron microscopy -- Congresses; Chemistry; Materials Science; Electronics and Microelectronics, Instrumentation; Solid State Physics and Spectroscopy; Measurement Science, Instrumentation