Microscopy of Semiconducting Materials  Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK /  [electronic resource] : 
edited by A. G. Cullis, J. L. Hutchison. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2005. 
 - xvi, 537 p. :  ill., digital ;  24 cm. 
 - Springer Proceedings in Physics,  107  0930-8989 ; .
<br/><br/><label>ISBN: </label>9783540319153 (electronic bk.) 9783540319146 (paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Surfaces--Congresses.<br/>Semiconductors--Characterization--Congresses.<br/>Materials--Microscopy--Congresses.<br/>Epitaxy--Congresses.<br/>High resolution electron microscopy--Congresses.<br/>Chemistry.<br/>Materials Science.<br/>Electronics and Microelectronics, Instrumentation.<br/>Solid State Physics and Spectroscopy.<br/>Measurement Science, Instrumentation.
<br/><br/><label>LC Class. No.: </label>QC611.6.S9  / M554 2005 
<br/><br/><label>Dewey Class. No.: </label>621.38152