TY  - BOOK
AU  - Egerton,Ray F..
ED  - SpringerLink (Online service)
TI  - Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 
SN  - 9780387260167 (electronic bk.)
AV  - QH212.E4 E354 2005
U1  - 502.825 22
PY  - 2005///
CY  - Boston, MA
PB  - Springer Science+Business Media, Inc.
KW  - Electron microscopy
KW  - Chemistry
KW  - Characterization and Evaluation Materials
KW  - Biological Microscopy
UR  - https://eresourcesptsl.ukm.remotexs.co/login?url=http://dx.doi.org/10.1007/b136495
ER  -