Fundamentals of Powder Diffraction and Structural Characterization of Materials - Pecharsky, Vitalij K.; Zavalij, Peter Y..; SpringerLink (Online service) (Boston, MA : Springer Science+Business Media, Inc., 2005)
Keywords: X-rays -- Diffraction -- Measurement; Powders -- Optical properties -- Measurement; X-ray crystallography; Chemistry; Characterization and Evaluation Materials; Physical Chemistry; Crystallography; Condensed Matter; Solid State Physics and Spectroscopy