Alford, Terry L. <br/><br/>
Fundamentals of nanoscale film analysis / 
Terry L. Alford, Leonard C. Feldman and James W. Mayer 
 - New York, N.Y. :  Springer,  2007 
 - xiv, 336 p. :  ill. ;  25 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780387292601 (hbk.) 0387292608 (hbk.)  RM342.06 0387292616 (e-book) 9780387292618 (e-book) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films<br/>Nanostructured materials