TY  - BOOK
AU  - Kaupp,G.
TI  - Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: application to rough and natural surfaces 
SN  - 3540284052 (hbk.)
PY  - 2006///
CY  - Berlin
PB  - Springer-Verlag
KW  - Atomic force microscopy
KW  - Near-field microscopy
N1  - Includes bibliographical references and index
ER  -