Kaupp, G. <br/><br/>
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching :  application to rough and natural surfaces / 
G. Kaupp. 
 - Berlin :  Springer-Verlag,  2006. 
 - xii, 292 p. :  ill. ;  24 cm. 
 - Nanoscience and technology. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>3540284052 (hbk.)  RM433.56 
<br/><br/><label>Standard No.: </label>9783540284055 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy.<br/>Near-field microscopy.