Venkataraman, Srikanth
BIST based on reseeding of LFSRs [microform] /
Srikanth Venkataraman
- Montreal : Perpustakaan Tun Seri Lanang, 2006
- 1 microfilm reel ; 35 mm.
Thesis (Master of Engineering) - McGill University, Montreal, 1993
RM147.20
Digital integrated circuits--Testing
Integrated circuits--Very large scale integration--Testing