Failure-free integrated circuit packages :  systematic elimination of failures through reliability engineering, failure analysis, and material improvements / 
Charles Cohn, Charles A. Harper, [editors] 
 - New York :  McGraw-Hill,  2005 
 - xix, 363 p. :  ill. ;  24 cm. 
 - McGraw-Hill professional engineering .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronic packaging<br/>Integrated circuits--Fault tolerance