Birkholz, Mario. <br/><br/>
Thin film analysis by x-ray scattering / 
Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel. 
 - Weinheim :  Wiley-VCH,  2006. 
 - xxii, 356 p. :  ill. ; 25 cm. 
<br/><br/><label>ISBN: </label>3527310525  RM373.18 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films--Analysis.<br/>X-ray spectroscopy.