Nelson, Wayne,  1936- <br/><br/>
Accelerated testing  :  statistical models, test plans, and data analyses / 
Wayne Nelson 
 - 2nd ed. 
 - New York :  John Wiley & Sons,  2004 
 - Wiley series in probability and mathematical statistics.  Applied probability and statistics .
<br/><br/> 'A Wiley-Interscience publication' 
<br/><br/>Includes bibliographical references 
<br/><br/><label>ISBN: </label>0471697362 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Failure time data analysis<br/>Reliability (Engineering)--Statistical methods<br/>Accelerated life testing--Statistical methods