TY  - BOOK
AU  - Sharma,Ashok K.
ED  - IEEE Solid-State Circuits Council
TI  - Semiconductor memories: technology, testing, and reliability 
SN  - 0780310004
PY  - 1997///
CY  - New York
PB  - IEEE (Institute of Electrical and Electronic Engineers)
KW  - Semiconductor storage devices
N1  - 'IEEE Solid-State Circuits Council, sponsor.'; Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/description/wiley039/2003533030.html
ER  -