Sharma, Ashok K. <br/><br/>
Semiconductor memories :  technology, testing, and reliability / 
Ashok K. Sharma 
 - New York :  IEEE (Institute of Electrical and Electronic Engineers),  1997 
 - xii, 462 p. :  ill. ;  26 cm. 
<br/><br/> 'IEEE Solid-State Circuits Council, sponsor.' 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0780310004  RM502.30 
<br/><br/><label>LCCN: </label>2003-533030 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor storage devices