Technological and statistical significance of physical test data /  by Chen Kwek Kong [et.al.]. 

 - Kuala Lumpur :  Rubber Research Institute,  1980. 
 - 30 p. :  ill.  ;  24 cm. 
 - RRIM technology bulletin ;  no.5 .
 - RRIM technology bulletin ;  no.5 .
<br/><br/><label>ISSN: </label>0126-9410 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Rubber--Testing.