TY  - BOOK
AU  - Jimenez,J.
TI  - Microprobe characterization of optoelectronic materials
SN  - 1560329416 (alk. paper)
PY  - 2003///
CY  - New York
PB  - Taylor & Francis
KW  - Semiconductors
KW  - Optical properties
KW  - Microprobe analysis
N1  - Includes bibliographical references and index
ER  -