Ahmed, Iftekhar <br/><br/>
VLSI circuit testing using probabilistic approach  [microform] / 
Iftekhar Ahmed 
 - Bangi :  Perpustakaan Tun Seri Lanang ,  2003 
 - 1 microfilm reel ;  35 mm . 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Large scale integration