Scanning electron microscopy and x-ray microanalysis / 
Joseph I. Goldstein ... [et al.] 
 - 3rd ed. 
 - New York :  Kluwer Academic/Plenum Publishers,  2003 
 - xix, 689 p. :  ill. (some col.) ;  26 cm. +  1 computer laser optical discs (4 3/4 in.) 
<br/><br/> Book is accompanied by one CD bearing the same call number and available at Makmal Multimedia, Perpustakaan Perubatan KKL 
<br/><br/><label>ISBN: </label>0306472929  RM366.51 
<br/><br/><label>LCCN: </label>2002-028276 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy<br/>X-ray microanalysis