Nelson, Wayne,  1936- <br/><br/>
Accelerated testing  :  statistical models, test plans, and data analyses / 
Wayne Nelson 
 - New York :  John Wiley & Sons,  1990 
 - xiv , 601 p. :  ill. ;  25 cm. 
 - Wiley series in probability and mathematical statistics. Applied probability and statistics .
<br/><br/> 'A Wiley-Interscience publication.' 
<br/><br/>Includes bibliographical references 
<br/><br/><label>ISBN: </label>0471522775 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Failure time data analysis<br/>Reliability (Engineering)--Statistical methods<br/>Accelerated life testing--Statistical methods