Fultz, Brent. <br/><br/>
Transmission electron microscopy and diffractometry of materials / 
Brent Fultz, James Howe. 
 - Berlin :  Springer,  2001. 
 - xix, 748 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>3540678417 (alk. paper)  RM357.10 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy.<br/>Transmission electron microscopy.<br/>X-ray diffractometer.