TY  - BOOK
AU  - Altaf-ul-Amin,Md
TI  - An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits
PY  - 1999///
CY  - Bangi
PB  - Perpustakaan Tun Seri Lanang
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Iddq testing
KW  - Metal oxide semiconductors, Complementary
N1  - Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999
ER  -