Altaf-ul-Amin, Md. <br/><br/>
An approach to current sensor and test processor design for simultaneous logic and IDDQ testing of CMOS integrated circuits  [microform] / 
Md. Altaf-ul-Amin 
 - Bangi :  Perpustakaan Tun Seri Lanang,  1999 
 - 1 microfilm reel ;  35 mm. 
<br/><br/>Thesis (M.Sc.) - Universiti Kebangsaan Malaysia, 1999 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing<br/>Iddq testing<br/>Metal oxide semiconductors, Complementary--Testing