Hosmer, David W. <br/><br/>
Applied logistic regression / 
David W. Hosmer, Stanley Lemeshow. 
 - 2nd ed. 
 - New York :  John Wiley & Sons,  2000. 
 - xii , 375 p. :  ill. ;  25 cm. 
 - Wiley series in probability and statistics. .
<br/><br/>References : p. 354-367. 
<br/><br/><label>ISBN: </label>0471356328  RM381.70 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Regression analysis.<br/>Logistic regression analysis.
<br/><br/><label>National Library of Medicine Call No.: </label>QA278.2