Electrical phenomena at interfaces :  fundamentals, measurements, and applications 

 - 2nd ed., rev. and expanded /  edited by Hiroyuki Ohshima, Kunio Furusawa 
 - New York :  M. Dekker,  1998 
 - xiii, 628 p. :  ill. ;  26 cm. 
 - Surfactant science series ;  v. 76 .
<br/><br/> Surfactant science series ; 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0824790391 (alk. paper)  RM944.70 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Surface chemistry<br/>Electric double layer