TY  - BOOK
AU  - Molyneaux,Robert F.
TI  - Built-in test design for the efficient testing of VSLI circuits (microform)
PY  - 1991///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
N1  - Thesis (Ph.D.) -The University of Rochester, 1991
ER  -