Molyneaux, Robert F. <br/><br/>
Built-in test design for the efficient testing of VSLI circuits (microform) / 
by Robert F. Molyneaux 
 - Ann Arbor, Mich. :  University Microfilms International,  1991 
 - 2 microfiches ;  11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) -The University of Rochester, 1991 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing